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    Synthesis, surface tension, optical and dielectric properties of bismuth oxide thin film

    Year: 2017

    Journal: Mater. Sci., Volume 35, MAR, page 87–93

    Authors: Tezel, Fatma Meydaneri; Kariper, I. Afsin

    Organizations: Karabuk University Scientific Research Project [KBU-BAP-13/1-YL-033]; Erciyes University Technopark

    Keywords: CBD technique; crystal growth; Zisman method; optical properties; surface tension

    Bismuth oxide thin film was deposited by chemical bath deposition (CBD) technique onto a glass substrate. The grain size (D), dislocation density (delta) and number of crystallites per unit area (N), i.e. structural properties of the thin film were determined as 16 nm, 39.06 x 10(-4) line/nm(2), 31.25 x 10(-3) 1/nm(2), respectively. Optical transmittance properties of the thin film were investigated by using a UV-Vis spectrophotometer. The optical band gap (E-g) for direct transitions, optical transmission (T %), reflectivity (R %), absorption, refractive index (n(r)), extinction coefficient (k), dielectric constant (is an element of) of the thin film were found to be 3.77 eV, 25.23 %, 32.25 %, 0.59, 3.62, 0.04 and 2.80, respectively. The thickness of the film was measured by AFM, and was found to be 128 nm. Contact angles of various liquids on the oxide thin film were determined by Zisman method, and surface tension was calculated to be 31.95 mN/m.
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