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    An exploratory study of the effects of the dielectric-barrier-discharge surface pre-treatment on the self-assembly processes of a (3-Aminopropyl) trimethoxysilane on glass substrates

    Year: 2007

    Journal: Applied Surface Science, Volume 253, Issue 16, 15 June 2007, Pages 6932-6938, 20111221

    Authors: Nai-Yi Cui, Chaozong Liu, Norman M.D. Brown and Brian J. Meenan

    Organizations: Department of Physical and Chemical Sciences, College of Science, North China University of Technology, Beijing 100041, China, Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK, School of Electrical and Mechanical Engineering, University of Ulster at Jordanstown, Newtownabbey, Co. Antrim BT37 0QB, UK

    X-ray photoelectron spectrometry (XPS), Fourier transform infrared spectrometry (FTIR), secondary-ion-mass spectrometry (SIMS) and contact angle measurement have been used in study of the enhancement effect of substrate pre-treatment by dielectric-barrier-discharge (DBD) for the self-assembly of a (3-Aminopropyl) trimethoxysilane (APTS) on glass substrates. In results, the concentration of the APTS molecules self-assembled on the surfaces of both the acetone-washed and the DBD-treated substrates were more than three times of that on the as-supplied substrate. Meanwhile, the self-assembly (SA) layers grown on the DBD-treated substrates have the best quality compared to those grown on the substrates pre-treated in other ways in terms of the silane-substrate bonding and the order of arrangement of the silane molecules.