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Applicability of TOF-SIMS for the Assessment of Lipid Composition of Cell Membrane Structures

Year: 2017

Journal: Biol. Membr., Volume 34, MAY-JUN, page 215–222

Authors: Gulin, A. A.; Pavlyukov, M. S.; Gusev, S. A.; Malakhova, Yu. N.; Buzin, A. I.; Chvalun, S. N.; Aldarov, K. G.; Klinov, D. V.; Gularyan, S. K.; Nadtochenko, V. A.

Keywords: mass spectrometry; TOF-SIMS; quantitative analysis; Langmuir Blodgett films; ion beam etching

Langmuir-Blodgett lipid films and plasma membranes of glioma cells were analyzed using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Bi-3(+) primary ion beam was determined to be the most efficient in various experimental setups. TOF-SIMS was shown to be applicable for a quantitative analysis of model lipid structures as well as plasma membranes of glioma cells U87MG in vitro. A combination of atomic-force microscopy and scanning electron microscopy yielded the depth resolution of similar to 10-20 nm for cell surface scanning by primary ion beam.