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    Atomic Force Microscopy and Micro-Raman Imaging of Mixed Langmuir-Blodgett Films of Ytterbium Bisphthalocyanine and Stearic Acid

    Year: 2002

    Journal: Langmuir 2002, 18, 3561-3566, 20111221

    Authors: L. Gaffo, C. J. L. Constantino W. C. Moreira, R. F. Aroca and O. N. Oliveira, Jr.

    Organizations: Instituto de Fisica de Sao Carlos, Universidade de Sao Paulo, Sao Carlos, SP, Brazil, Materials and Surface Science Group, University of Windsor, Windsor, Ontario N9B 3P4, Canada, and Departamento de Quimica, Universidade Federal de Sao Carlos, Sao Carlos, SP, Brazil

    The degree of mixing and surface coverage in Langmuir-Blodgett (LB) films of ytterbium bisphthalocyanine (YbPc2) mixed with stearic acid (SA) has been probed using atomic force microscopy (AFM) and micro-Raman imaging. The morphologies extracted for LB films at the nanometer (AFM) and micrometer (micro-Raman) scales are consistently in good agreement. The results show that a 5-layer mixed LB film with 75/25% YbPc2/SA (relative content by weight) displays smaller and more homogeneous distribution of aggregates compared with a 5-layer mixed film of 25/75% YbPc2/SA. Raman microscopy of neat LB films of ytterbium bisphthalocyanine (YbPc2) and mixed YbPc2/stearic acid LB films deposited on glass and silver islands is reported. Resonance Raman scattering (RRS), surface-enhanced resonance Raman scattering (SERRS), and surface-enhanced Raman scattering (SERS) were obtained using laser lines at 633 and 780 nm. The enhanced (SERRS) and unenhanced (RRS) resonance Herzberg-Teller spectra of neat YbPc2 LB films and mixed LB films excited with the 633 nm line are identical.