Contact
    Start Publications Dewetting of the Three-Phase Contact Line on Solids
    ←  Publication Finder
    Attension

    Dewetting of the Three-Phase Contact Line on Solids

    Year: 2010

    Journal: Langmuir, 2010, 26 (11), pp 7682–7685, 20111221

    Authors: Xiaohua Fang*†, Miguel Pimentel‡, Jonathan Sokolov§ and Miriam Rafailovich*

    Organizations: † Langmuir Center for Colloids and Interfaces, Department of Earth and Environmental Engineering, Columbia University, New York, New York 10027 ‡ Facultad de Ciencias, Departamento de Matemticas, Universidad Autnoma de Madrid, Madrid 28049, Spain § Department of Materials Science and Engineering, Stony Brook University, Stony Brook, New York 11794

    Liquid adsorption on a substrate has great applications in inkjet printing as well as micro/nano fabrication. In this letter, we focus on obtaining a better understanding of the pinning−dewetting phenomenon through solubility measurements during droplet evaporation. The physical adsorption/penetration of liquid on the substrate material is considered to be responsible for the pinning of the three-phase contact line. Once the adsorption surrounding the contact line reaches equilibrium, dewetting occurs and the droplet shrinks. The absorption kinetics of water molecules on different substrates was monitored. An analytical technique was developed to measure the threshold adsorption density of trace solvents on these substrates including different polymers, silicon, and gold.