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Formation of Self-Assembled Organosilicon-Functionalized Quinquethiophene Monolayers by Fast Processing Techniques

Year: 2012

Journal: Langmuir, 2012, 28 (46), 16186–16195, 20131009

Authors: Elena V. Agin, Ivan A. Usov, Oleg V. Borshchev, Jingbo Wan, Ahmed Mourran, Maxim A. Shcherbina, Artem V. Bakirov, Souren Grigorian, Martin Möller, Sergei N. Chvalun, Sergei A. Ponomarenko

Organizations: Enikolopov Institute of Synthetic Polymeric Materials of Russian Academy of Sciences, Profsoyuznaya st. 70, Moscow 117393, Russia; Interactive Materials Research DWI an der RWTH Aachen e.V. and Chair of Textile and Macromolecular Chemistry, RWTH, Aachen University, Forckenbeckstr. 50, 52056 Aachen, Germany; Institute of Physics, University of Siegen, Walter-Flex-Str., 3 D-57068 Siegen, Germany

Different techniques for a relatively fast self-assembled monolayer film formation such as Langmuir–Blodgett (LB), spin-coating, and dip-coating methods have been compared using chloro[11-(5′′′′-ethyl-2,2′:5′,2″:5‴,2‴:5‴,2′′′′-quinquethiophene-5-yl)undecyl]dimethylsilane as a reactive precursor. It was shown that both spin-coating and LB techniques are very promising methods for preparation of highly ordered monolayer films of organosilicon-functionalized quinquethiophene with vertical orientation of oligothiophene fragments, while dip-coating gives only partial coverage. Optimal conditions for complete filling out the substrate surface by the quinquethiophene-containing monolayer by spin-coating and LB methods have been found. Grazing incidence X-ray diffraction measurements confirmed formation of in-plane crystalline order within the monolayer film. Changes in the layer structure were established by X-ray reflectivity and grazing incidence X-ray diffraction methods.