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    GISAXS Characterization of Order in Hexagonal Monolayers of FePt Nanocrystals

    Year: 2010

    Journal: J. Phys. Chem. C, 2010, 114 (34), 14427–14432, 20131009

    Authors: Andrew T. Heitsch, Reken N. Patel, Brian W. Goodfellow, Detlef-M. Smilgies, Brian A. Korgel

    Organizations: Department of Chemical Engineering, Texas Materials Institute, Center for Nano- and Molecular Science and Technology, The University of Texas at Austin, Austin, Texas 78712-1062, USA; Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853, UA

    Hexagonally close-packed monolayers of FePt nanocrystals were deposited on silicon substrates by Langmuir−Blodgett, Langmuir−Schäfer, or spin-coating techniques and characterized by scanning electron microscopy (SEM) and grazing incidence small-angle X-ray scattering (GISAXS). The extent of order in each nanocrystal film is quantified based on the GISAXS data and compared. The LB technique provided the most ordered superlattice films