Year: 2017
Journal: Text. Res. J., Volume 87, JAN, page 193–207
Authors: Park, Sohyun; Kim, Jooyoun; Park, Chung Hee
Organizations: National Research Foundation (NRF) of Korea - Korean government (MSIP) [2015R1A2A2A03002760]; NRF of Korea - Korean government
Keywords: superhydrophobicity; plasma etching; plasma enhanced chemical vapor deposition (PECVD); contact angle; dual-scale roughness