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    Linear optics in the second-order characterization of thin films

    Year: 2006

    Journal: Chemical Physics Letters, Volume 419, Issues 4-6, 26 February 2006, Pages 492-495, 20111221

    Authors: Stefano Cattaneo, Katja Miettinen, Elina Vuorimaa, Helge Lemmetyinen and Martti Kauranen

    Organizations: Institute of Physics, Tampere University of Technology, Korkeakoulunkatu 3, FI-33101 Tampere, Finland, Institute of Materials Chemistry, Tampere University of Technology, FI-33101 Tampere, Finland

    We study the importance of the linear optical properties of thin molecular films in their second-order nonlinear optical characterization. Two-beam second-harmonic generation is used to determine the susceptibility components of Langmuir–Blodgett films of terthiophene-vinylbenzoate and yields consistent results only when the linear properties of the films are included in the model. While this is expected for thick multilayer assemblies (not, vert, similar140 nm), we show that the same holds also for a monomolecular layer (not, vert, similar2.8 nm). In particular, we find that the linear response of the monolayer is well described by the refractive index of the thick films.