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    Micelle-assisted bilayer formation of cetyltrimethylammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques

    Year: 2011

    Journal: Thin Solid Films, Volume 519, Issue 9, 28 February 2011, Pages 2821-2824, 20110525

    Authors: Rodenhausen K.B. 1 2, Guericke M. 3, Sarkar A. 2 4, Hofmann T. 2 4, Ianno N. 2 4, Schubert M. 2 4, Tiwald T.E. 5, Solinsky M. 6, Wagner M. 6

    Last authors: M. Wagner

    Organizations: 1 Department of Chemical and Biomolecular Engineering, University of Nebraska-Lincoln, USA 2 Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, USA 3 University of Heidelberg, Germany 4 Department of Electrical Engineering, University of Nebraska-Lincoln, USA 5 J.A. Woollam Co., Inc., 645 Main Street, Suite 102, Lincoln, NE 68508, USA 6 The Procter & Gamble Company, 11810 E. Miami River Rd., Cincinnati, OH 45252, USA

    Country: Germany, USA, US, United States, United States of America, America

    We report on a combinatorial approach to study the formation of ultra-thin organic films using in-situ spectroscopic ellipsometry and quartz crystal microbalance methods. In contrast to the quartz crystal microbalance, which is sensitive to the total mass attached to the surface, including coupled and entrapped solvent, spectroscopic ellipsometry only measures the amount of adsorbent on the surface. By using these two techniques in tandem, we define and determine the solvent fraction of cetyltrimethylammonium bromide thin films adsorbed onto a gold-coated quartz crystal. Cetyltrimethylammonium bromide thin films grown from aqueous solutions above the critical micelle concentration reveal critical phases in thickness and porosity evolution. We relate these effects to the mechanisms of formation and removal and the structure of cetyltrimethylammonium bromide films, which we determine to have systemic defects due to the presence of micelles.