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Thickness Dependence of the Optical Anisotropy for Porphyrin Octaester Langmuir-Schaefer Films

Year: 2002

Journal: -, 20111221

Authors: C. Goletti, R. Paolesse, E. Dalcanale, T. Berzina, C. Di Natale, G. Bussetti, P. Chiaradia, A. Froiio, L. Cristofolini, M. Costa, and A. Amico

Organizations: Dipartimento di Fisica and Uniti INFM, Universiti di Roma "Tor Vergata", Via della Ricerca Scientifica 1, 00133 Roma, Italy, Dipartimento di Scienze e Tecnologie Chimiche and Uniti INFM, Universiti di Roma "Tor Vergata", Via della Ricerca Scientifica 1, 00133 Roma, Italy, Dipartimento di Chimica Organica e Industriale and Uniti INSTM, Universiti di Parma, Parco Area delle Scienze 17/A, 43100 Parma, Italy, Dipartimento di Fisica and Uniti INFM, Universiti di Parma, Parco Area delle Scienze 7/A, 43100 Parma, Italy, and Dipartimento di Ingegneria Elettronica, Universiti di Roma "Tor Vergata", Via della Ricerca Scientifica 1, 00133 Roma, Italy

We have studied the optical anisotropy of porphyrin layers with different thicknesses deposited onto gold substrates by the Langmuir-Schaefer technique. In coincidence with the Soret band of the molecule, the optical spectral line shape as determined by reflectance anisotropy spectroscopy exhibits a characteristic, large structure, which changes from a "peaklike" to a "derivative-like" shape at a well-defined thickness (8-10 monolayers). Weinterpret this result in the framework of electronic effects due to structural changes in the layers, yielding solid-state effects originating from the coupling of the π orbitals of the porphyrin macrocycles.