Year: 2023
Journal: Microsystems & Nanoengineering, Volume 9, 2023-05-04
Authors: McKibben, Nicholas; Ryel, Blake; Manzi, Jacob; Muramutsa, Florent; Daw, Joshua; Subbaraman, Harish; Estrada, David; Deng, Zhangxian
Keywords: Electrical and electronic engineering; Electronic properties and materials