Year: 2020
Journal: ACS Appl. Mater. Interfaces, Volume 12, JAN 15, page 2655–2661
Authors: Wang, Zheng; Henke, Sebastian; Paulus, Michael; Welle, Alexander; Fan, Zhiying; Rodewald, Katia; Rieger, Bernhard; Fischer, Roland A.
Keywords: defect engineering; SURMOF; HKUST-1; thin films; UV-vis; defective linkers