Year: 2022
Journal: Rev. Sci. Instrum., Volume 93, SEP 1
Authors: Tein, Y. Summer; Thompson, Benjamin R.; Majkrzak, Chuck; Maranville, Brian; Renggli, Damian; Vermant, Jan; Wagner, Norman J.
Organizations: NIST, U.S. Department of Commerce [370NANB17H302]; National Institute of Standards and Technology, U.S. Department of Commerce; National Science Foundation [DMR-0944772]; Swiss National Science Foundation [200021-165974]