Year: 2020
Journal: Vacuum, Volume 175, MAY
Authors: Tincu, B.; Avram, M.; Avram, A.; Tutunaru, O.; Tucureanu, V.; Matei, A.; Burinaru, T.; Comanescu, F.; Demetrescu, I.
Organizations: Operational Programme Human Capital of the Ministry of European Funds [51668/09.07.2019, 124705]; UEFISCDIConsiliul National al Cercetarii Stiintifice (CNCS)Unitatea Executiva pentru Finantarea Invatamantului Superior, a Cercetarii, Dezvoltarii si Inovarii (UEFISCDI) [PN-III-P1-1.2-PCCDI-2017-0214, 3PCCDI/2018]
Keywords: Si/SiO2 holes; Suspended single layer graphene; Chemical vapor deposition; Scanning electron microscopy