Year: 2022
Journal: Adv. Mater. Interfaces, Volume 9, OCT
Authors: Valour, Arnaud; Hochedel, Marion; Royon, Maxime; Usuga Higuita, Maria Alejandro; Crespo-Monteiro, Nicolas; Jourlin, Yves
Organizations: French National Research Agency (ANR) [ANR-21-CE08-0042-01]; French Region Auvergne-Rhone-Alpes; IDEX Lyon (University of Lyon) in the Scientific Breakthrough program; French RENATECH+ network led by the CNRS
Keywords: anti-counterfeiting; multiscale-structuration; nanosphere lithography; rapid thermal nitridation; TiN thin films; TiO; (2) sol-gel