Products
Solutions
Instrument Selector
Knowledge
Service & Support
Blog
Pod
Events
Contact
Search the site
Products
Solutions
Instrument Selector
Knowledge
Service & Support
Blog
Pod
Events
Sign in
Contact
Visit our other sites
Global
Biolin Scientific China
German Webshop
Visit our other sites
Biolin Scientific China
For our Chinese friends
German Webshop
Deliveries are only possible within Germany
Start
Products
KSV NIMA
Characterization on Thin Films
Share
Link
Copy link
Close
Share page
Email
LinkedIn
Twitter
Facebook
Characterization of thin films
MicroBAM
MicroBAM enables visualization of monolayers at the air-water interface in a Langmuir Trough.
Surface Potential Sensor
The KSV NIMA Surface Potential Sensor (SPOT) is used for determining molecular orientation changes in Langmuir films.
ISR Flip
Next-generation interfacial shear rheometer. Enables highly sensitive measurements of interfacial viscoelasticity at air-liquid/liquid-liquid interfaces.