The Q-Sense Ellipsometry Module enables simultaneous QCM-D and ellipsometry measurements on the same substrate.
As the complexity of systems under study increases, one technique alone may not provide all the required information. Merging several techniques into the same setup and monitoring events on the same surface may provide complementary information and enable a more complete analysis. For example, both QCM-D and ellipsometry measurements can be conducted in situ in the flow- and temperature-controlled ellipsometry module. The Q-Sense Ellipsometry module is compatible with the Q-Sense Explorer system (previously Q-Sense E1).